US PATENT SUBCLASS 324 / 644
.~.~.~.~ To determine dimension (e.g., distance or thickness)

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
629  DF  .~ Distributive type parameters {6}
637  DF  .~.~ Using transmitted or reflected microwaves {3}
642  DF  .~.~.~ Where energy is reflected (e.g., reflectometry) {4}
644.~.~.~.~ To determine dimension (e.g., distance or thickness)

DEFINITION

Classification: 324/644

To determine dimension (e.g., distance or thickness):

(under subclass 642) Subject matter including measurement of the physical characteristics of the test substance pertaining to its size or its distance from a reference point.

SEE OR SEARCH THIS CLASS, SUBCLASS:

635, for dimensional measurement of a test object by measuring the object's distributive type parameters using resonance.

662, and 671, for dimensional measurement using capacitive-type measurements.

716, for dimensional measurement by using resistive or conductive type measurements.