US PATENT SUBCLASS 324 / 638
.~.~.~ Scattering type parameters (e.g., complex reflection coefficient)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
629  DF  .~ Distributive type parameters {6}
637  DF  .~.~ Using transmitted or reflected microwaves {3}
638.~.~.~ Scattering type parameters (e.g., complex reflection coefficient)

DEFINITION

Classification: 324/638

Scattering type parameters (e.g., complex reflection coefficient):

(under subclass 637) Subject matter including the measurement of characteristics at network ports which are complex ratios representing the amplitude and phase of incident and reflected power in traveling waves.

(1) Note. Measurements of voltage and current become more difficult as frequency increases, therefore directional power ratio measurements, expressed as scattering parameters, are used to characterize objects at high frequencies.

(2) Note. Microwave network analyzers belong in this subclass. Low frequency network analyzers belong in subclass 650 or subclass 615.