US PATENT SUBCLASS 324 / 513
.~.~ Where component moves while under test

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
513.~.~ Where component moves while under test {2}
514  DF  .~.~.~> By exposing component to liquid or gas while under test
515  DF  .~.~.~> Using a particular sensing electrode {3}

DEFINITION

Classification: 324/513

Where components moves while under test:

(under subclass 512) Subject matter where component under test is moved linearly, or by stressing, bending, rotating, jarring, vibrating, flexing, etc., while under test.

(1) Note. This subclass includes for example, a cable under test passing a stationary sensing electrode, which locates a fault in the cable, as a cable is wound on a takeup reel.