US PATENT SUBCLASS 324 / 512
.~ For fault location

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512.~ For fault location {10}
513  DF  .~.~> Where component moves while under test {2}
519  DF  .~.~> By capacitance measuring
520  DF  .~.~> By frequency sensitive or responsive detection
521  DF  .~.~> By phase sensitive or responsive detection
522  DF  .~.~> By voltage or current measuring {2}
525  DF  .~.~> By resistance or impedance measuring {1}
527  DF  .~.~> By applying a test signal {3}
534  DF  .~.~> By reflection technique
535  DF  .~.~> By time measuring
536  DF  .~.~> By spark or arc discharge

DEFINITION

Classification: 324/512

For fault location:

(under subclass 500) Subject matter where a signal produced indicates either direction or distance to a fault.

(1) Note. Subclasses, which are indented under fault location, distinguish from the main sections preceding and subsequent thereto in that here, under the fault location section, a determination is made as to where the fault is located as opposed to whether or not a fault exists.

(2) Note. The indented subclasses under this subclass include a circuit or an instrument for determining the location of a defect.

SEE OR SEARCH CLASS

379, Telephonic Communications,

175.3, for locating faults in telephone lines.