US PATENT SUBCLASS 324 / 535
.~.~ By time measuring

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
535.~.~ By time measuring

DEFINITION

Classification: 324/535

By time measuring:

(under subclass 512) Subject matter where a defect produces a fault signal which is evaluated as to time to indicate the location of the fault.

SEE OR SEARCH THIS CLASS, SUBCLASS:

532, for an evaluation of the time of an applied test signal to indicate fault location.