US PATENT SUBCLASS 324 / 534
.~.~ By reflection technique

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
534.~.~ By reflection technique

DEFINITION

Classification: 324/534

By reflection technique:

(under subclass 512) Subject matter where the defect causes, creates, or produces a fault signal which is reflected and evaluated to indicate the location of the fault.

SEE OR SEARCH THIS CLASS, SUBCLASS:

533, for an evaluation of a reflected applied test signal to indicate fault location.