US PATENT SUBCLASS 324 / 527
.~.~ By applying a test signal

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
527.~.~ By applying a test signal {3}
528  DF  .~.~.~> Tracing test signal to fault location {2}
531  DF  .~.~.~> At fault site
532  DF  .~.~.~> Using time measuring {1}

DEFINITION

Classification: 324/527

By applying a test signal:

(under subclass 512) Subject matter where a test signal is applied to the conductor under test to locate the fault.

SEE OR SEARCH THIS CLASS, SUBCLASS:

523, for measuring the current or voltage of an applied test signal to locate a fault.