US PATENT SUBCLASS 324 / 531
.~.~.~ At fault site

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
527  DF  .~.~ By applying a test signal {3}
531.~.~.~ At fault site

DEFINITION

Classification: 324/531

At fault site:

(under subclass 527) Subject matter where the applied test signal causes, creates, or produces a fault signal at or near the fault site.