US PATENT SUBCLASS 324 / 528
.~.~.~ Tracing test signal to fault location

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
527  DF  .~.~ By applying a test signal {3}
528.~.~.~ Tracing test signal to fault location {2}
529  DF  .~.~.~.~> Using a magnetic field sensor
530  DF  .~.~.~.~> Using an electric field sensor

DEFINITION

Classification: 324/528

Tracing test signal of fault location:

(under subclass 527) Subject matter where an applied test signal undergoes a change at the location of the fault.