US PATENT SUBCLASS 324 / 532
.~.~.~ Using time measuring

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
527  DF  .~.~ By applying a test signal {3}
532.~.~.~ Using time measuring {1}
533  DF  .~.~.~.~> Of reflected test signal

DEFINITION

Classification: 324/532

Using time measuring:

(under subclass 527) Subject matter where the applied test signal is evaluated as to time to indicate the location of a fault.

SEE OR SEARCH THIS CLASS, SUBCLASS:

535, where the defect produces a fault signal which is evaluated as to time to indicate fault location.