US PATENT SUBCLASS 324 / 533
.~.~.~.~ Of reflected test signal

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
527  DF  .~.~ By applying a test signal {3}
532  DF  .~.~.~ Using time measuring {1}
533.~.~.~.~ Of reflected test signal

DEFINITION

Classification: 324/533

Of reflected test signal:

(under subclass 532) Subject matter where the defect causes the applied test signal to be reflected and the reflected signal is evaluated as to time to determine the location of the fault.

SEE OR SEARCH THIS CLASS, SUBCLASS:

534, for reflection evaluation techniques which do use an applied test signal.