US PATENT SUBCLASS 324 / 558
.~ Where element moves while under test


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324 /   HD   ELECTRICITY: MEASURING AND TESTING

557  DF  FOR INSULATION FAULT OF NONCIRCUIT ELEMENTS {2}
558.~ Where element moves while under test


DEFINITION

Classification: 324/558

Where element moves while under test:

(under subclass 557) Subject matter where the noncircuit element under test moves while under test.

SEE OR SEARCH THIS CLASS, SUBCLASS:

513+, where a circuit component moves while under test.