US PATENT SUBCLASS 324 / 446
.~.~ Having conductance probe structure

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

425  DF  ELECTROLYTE PROPERTIES {3}
439  DF  .~ Using a conductivity determining device {8}
446.~.~ Having conductance probe structure {3}
447  DF  .~.~.~> With movable or adjustable electrode
448  DF  .~.~.~> With concentric electrodes
449  DF  .~.~.~> With axially arranged electrodes

DEFINITION

Classification: 324/446

Having conductance probe structure:

(under subclass 439) Subject matter in which conductance probe element is of particular interest.