US PATENT SUBCLASS 324 / 467
.~.~ Using test material desorption

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

459  DF  USING IONIZATION EFFECTS {2}
464  DF  .~ For analysis of gas, vapor, or particles of matter {6}
467.~.~ Using test material desorption

DEFINITION

Classification: 324/467

Using test material desorption:

(under subclass 464) Subject matter wherein the material to be monitored is placed upon a filament which is heated until the material evaporates (desorbs) forming ions which are then analyzed.