US PATENT SUBCLASS 324 / 670
.~.~.~.~.~.~ For temperature variations

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663  DF  .~.~.~ Where a material or object forms part of the dielectric being measured {4}
664  DF  .~.~.~.~ To determine water content {3}
669  DF  .~.~.~.~.~ With compensation means {1}
670.~.~.~.~.~.~ For temperature variations

DEFINITION

Classification: 324/670

For temperature variations:

(under subclass 669) Subject matter including the errors or undesirable characteristics caused by an increase or decrease in ambient temperature.

SEE OR SEARCH THIS CLASS, SUBCLASS:

685, for measuring or testing lumped type parameters by capacitive type measurement with compensation for temperature variation.

721, for measuring or testing lumped type parameters by resistive or conductive type measurement with compensation for temperature variation.