US PATENT SUBCLASS 324 / 669
.~.~.~.~.~ With compensation means

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663  DF  .~.~.~ Where a material or object forms part of the dielectric being measured {4}
664  DF  .~.~.~.~ To determine water content {3}
669.~.~.~.~.~ With compensation means {1}
670  DF  .~.~.~.~.~.~> For temperature variations

DEFINITION

Classification: 324/669

With compensation means:

(under subclass 664) Subject matter including means to offset errors or undesirable characteristics in the measurement or test apparatus or process.

SEE OR SEARCH THIS CLASS, SUBCLASS:

684+, for measuring or testing lumped type parameters by capacitive measurement with compensation.

720+, for measuring or testing lumped type parameters by resistive or conductive measurement with compensation.