US PATENT SUBCLASS 324 / 321
.~.~ Sample holder structure

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

300  DF  PARTICLE PRECESSION RESONANCE {7}
318  DF  .~ Spectrometer components {3}
321.~.~ Sample holder structure

DEFINITION

Classification: 324/321

Sample holder structure:

(under subclass 318) Subject matter comprising sample holders to be used specifically with a spectrometer.