US PATENT SUBCLASS 324 / 316
.~ Using an electron resonance spectrometer system


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

300  DF  PARTICLE PRECESSION RESONANCE {7}
316.~ Using an electron resonance spectrometer system {1}
317  DF  .~.~> Including a test sample and control sample


DEFINITION

Classification: 324/316

Using an electron resonance spectrometer system:

(under subclass 300) Subject matter in which a spectrometer is used to induce and measure electron resonance of a sample material.

(1) Note. The electrons of atoms of a sample material refers to the electrons of a single atom as well as electrons of bonded atoms.

(2) Note. A spectrometer system as used here would include at least a signal transmitter coupled to a microwave cavity in which a sample material is placed between the poles of a steady magnetic field and a receiver coupled to relay sample material resonance to an indicator.