US PATENT SUBCLASS 324 / 656
.~.~.~ Including a comparison or difference circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
654  DF  .~.~ Using inductive type measurement {2}
656.~.~.~ Including a comparison or difference circuit {1}
657  DF  .~.~.~.~> Using a bridge circuit

DEFINITION

Classification: 324/656

Including a comparison or difference circuit:

(under subclass 654) Subject matter wherein lumped type inductive values are measured by correlating two or more electrical quantities.

SEE OR SEARCH THIS CLASS, SUBCLASS:

606, for signal evaluation or processing including comparison or difference techniques.

647+, for measuring distributive type parameters by utilizing comparison or difference circuits.

665+, for measuring lumped type parameters by capacitive type measurements for water content including comparison or

difference circuits.

672+, for measuring lumped type parameters of an object or material including its dielectric characteristic by utilizing comparison or difference circuits.

705+, for measuring lumped type parameters by resistive or conductive type measurement including comparison or difference circuits.