US PATENT SUBCLASS 324 / 724
.~.~.~.~ Using a probe type structure


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
722  DF  .~.~.~ Device or apparatus determines conductivity effects {2}
724.~.~.~.~ Using a probe type structure


DEFINITION

Classification: 324/724

Using a probe type structure:

(under subclass 722) Subject matter wherein the apparatus has a particular shape or configuration to improve its transducing or pickup function.

SEE OR SEARCH THIS CLASS, SUBCLASS:

690, for measuring or testing lumped type parameters with capacitive sensing means which include a probe type structure.

696, for measuring or testing lumped type parameters with water content determination using a conductivity effects detector with a probe type structure.

715+, for measuring or testing lumped type parameters using resistance or conductance type measurement with a voltage or current signal evaluation or processing circuit and a particular probe.

SEE OR SEARCH CLASS

338, Electrical Resistors, 34+, for condition responsive resistors.