US PATENT SUBCLASS 324 / 76.15
.~.~.~ With sampler

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.12  DF  .~ Analysis of complex waves {3}
76.13  DF  .~.~ Amplitude distribution {5}
76.15.~.~.~ With sampler

DEFINITION

Classification: 324/76.15

With sampler:

(under subclass 76.13) Subject matter including a device whose output is a series of discrete values representative of the values of an input at a series of points in time.

SEE OR SEARCH THIS CLASS, SUBCLASS:

76.24, for sampling in a frequency spectrum analyzer.

76.38, for sampling, per se, in analysis of complex waves.

76.42, for sampling by frequency comparison in frequency of cyclic current or voltage.

76.58, for sampling in digital output by phase comparison.