US PATENT SUBCLASS 324 / 468
.~.~ Using thermal ionization


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324 /   HD   ELECTRICITY: MEASURING AND TESTING

459  DF  USING IONIZATION EFFECTS {2}
464  DF  .~ For analysis of gas, vapor, or particles of matter {6}
468.~.~ Using thermal ionization


DEFINITION

Classification: 324/468

Using thermal ionization:

(under subclass 464) Subject matter wherein the gas, vapor, etc., to be monitored contacts a heated positive electrode causing positive ion emission, which ions are then collected for analysis by a negative electrode spaced from the heated positive electrode.

(1) Note. The mechanism here differs from thermionic emission ionization below since ionization is not caused by electron collision.