US PATENT SUBCLASS 324 / 516
.~.~.~.~ Metal chain

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
513  DF  .~.~ Where component moves while under test {2}
515  DF  .~.~.~ Using a particular sensing electrode {3}
516.~.~.~.~ Metal chain

DEFINITION

Classification: 324/516

Metal chain:

(under subclass 515) Subject matter where the sensing electrode comprises flexible linked elements which contact the moving component under test.