US PATENT SUBCLASS 324 / 238
.~.~.~ Material flaw testing

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

200  DF  MAGNETIC {24}
228  DF  .~ With means to create magnetic field to test material {5}
234  DF  .~.~ Electrically energized nonforce type sensor {3}
238.~.~.~ Material flaw testing

DEFINITION

Classification: 324/238

Material flaw testing:

(under subclass 234) Subject matter wherein the material is magnetically tested for defects in the material.

(1) Note. A defect is any blemish, crack, or other inherent imperfection in a material that weakens the material.

SEE OR SEARCH THIS CLASS, SUBCLASS:

213, for magnetic recording mediums attached to a tested magnetized material to record the material field.

216, for flaw testing of magnetized material with magnetic particles.

217+, for railroad flaw testing.

219+, for flaw testing when the sensor is within the material. 237, for flaw testers of the oscillator type.