(under subclass 200) Subject matter wherein the apparatus to sense and indicate the sensing of the magnetic field includes structure to correct for some condition which affects the test.
(1) Note. The magnetic field tested may be a magnetic field, per se, or a magnetic field modified by a material under test.
(2) Note. The condition may be magnetic interference, the spacing of the material tested with respect to the magnetic sensing means, or some condition of the apparatus to sense and indicate.
SEE OR SEARCH THIS CLASS, SUBCLASS:
224, for temperature control of the tested material or an element of the test circuit.
244, for magnetometers having disturbing magnetic field compensation.
