US PATENT SUBCLASS 324 / 310
.~.~ By scanning sample frequency spectrum

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

300  DF  PARTICLE PRECESSION RESONANCE {7}
307  DF  .~ Using a nuclear resonance spectrometer system {8}
310.~.~ By scanning sample frequency spectrum

DEFINITION

Classification: 324/310

By scanning sample frequency spectrum:

(under subclass 307) Subject matter wherein the application of pulsed energy to an atom nucleus over a controlled range of frequencies results in relative energy absorption by the atom or atoms of a sample material at resonance.

(1) Note. Scanning may also take place as a result of an increase or decrease in magnetic field strength.