US PATENT SUBCLASS 324 / 210
.~ Magnetic information storage element testing


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

200  DF  MAGNETIC {24}
210.~ Magnetic information storage element testing {2}
211  DF  .~.~> Memory core storage element testing
212  DF  .~.~> Dynamic information element testing


DEFINITION

Classification: 324/210

Magnetic information storage element testing:

(under subclass 200) Subject matter which includes a magnetic recorder element to be tested magnetically, means to create a magnetic test signal to be either sensed by the tested element or recorded on the tested element, the said apparatus to sense the magnetic field either (1) being or including the tested element itself, or (2) sensing the recorded test signal on the tested element, the said apparatus to indicate the sensing of the test magnetic signal being responsive to the apparatus to sense the signal or to the recorder element tested.

(1) Note. The testing device is not integral with the information device tested.

(2) Note. A prerecorded test signal on a magnetic storage element tested may take the place of the means to create a test signal.

SEE OR SEARCH CLASS

29, Metal Working,

603, for processes of making magnetic recording reproducing transducers.

346, Recorders, 33, for a magnetic recorder with an external operating means, and subclass 74.2 for magnetic pictorial or s:graphic recorders.

365, Static Information Storage and Retrieval,

201, for specifics of a memory which are tested for defects or erroneous information.

702, Data Processing: Measuring, Calibrating, or Testing,

108+, for testing system, particularly subclasses 117+ for testing of circuit.

714, Error Detection/Correction and Fault Detection/Recovery,

718+, for diagnostic testing of memory systems.