US PATENT SUBCLASS 324 / 718
.~.~.~.~.~ To detect a flaw or defect

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
713  DF  .~.~.~ With voltage or current signal evaluation {2}
715  DF  .~.~.~.~ Including a particular probing technique (e.g., four point probe) {3}
718.~.~.~.~.~ To detect a flaw or defect

DEFINITION

Classification: 324/718

To detect a flaw defect:

(under subclass 715) Subject matter including means to detect any discontinuity in a substance that would be harmful to the proper functioning of the substance.

SEE OR SEARCH THIS CLASS, SUBCLASS:

537, for fault detection in circuit components.