US PATENT SUBCLASS 324 / 715
.~.~.~.~ Including a particular probing technique (e.g., four point probe)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
713  DF  .~.~.~ With voltage or current signal evaluation {2}
715.~.~.~.~ Including a particular probing technique (e.g., four point probe) {3}
716  DF  .~.~.~.~.~> To determine dimension (e.g., distance or thickness)
717  DF  .~.~.~.~.~> To determine material composition
718  DF  .~.~.~.~.~> To detect a flaw or defect

DEFINITION

Classification: 324/715

Including a particular probing technique (e.g., four point probe):

(under subclass 713) Subject matter wherein electrical contact is made at a specified point, in particular fashion in order to effect a measurement or test.

SEE OR SEARCH THIS CLASS, SUBCLASS:

609, for measuring or testing electrical characteristics or parameters for substance or environment evaluation using a particular sensing technique.