US PATENT SUBCLASS 324 / 716
.~.~.~.~.~ To determine dimension (e.g., distance or thickness)

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
713  DF  .~.~.~ With voltage or current signal evaluation {2}
715  DF  .~.~.~.~ Including a particular probing technique (e.g., four point probe) {3}
716.~.~.~.~.~ To determine dimension (e.g., distance or thickness)

DEFINITION

Classification: 324/716

To determine dimension (e.g., distance or thickness):

(under subclass 715) Subject matter including means to evaluate alterations in the physical shape of an object.

SEE OR SEARCH THIS CLASS, SUBCLASS:

635, for dimensional measurement by using resonant frequency measurements.

644, for measuring a dimension using transmitted or reflected energy distributions.

662, for dimensional measurement by using capacitive type measurements.

671, for dimensional measurements by using dielectric characteristic measurements.

699, for dimensional change measurement by using conductivity effects of lumped type parameters.