US PATENT SUBCLASS 324 / 76.21
.~.~.~ By Fourier analysis

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.12  DF  .~ Analysis of complex waves {3}
76.19  DF  .~.~ Frequency spectrum analyzer {7}
76.21.~.~.~ By Fourier analysis

DEFINITION

Classification: 324/76.21

By Fourier analysis:

(under subclass 76.19) Subject matter wherein the energy distribution is taken at discrete harmonic components, i.e., harmonics, of the given signal.

SEE OR SEARCH CLASS

702, Data Processing: Measuring, Calibrating, or Testing,

77, for Fourier analysis in a waveform measuring system.

708, Electrical Computers: Arithmetic Processing and Calculating,

823+, for analog integrators, per se.