US PATENT SUBCLASS 324 / 240
.~.~.~ Material flaw testing

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

200  DF  MAGNETIC {24}
228  DF  .~ With means to create magnetic field to test material {5}
239  DF  .~.~ Induced voltage-type sensor {2}
240.~.~.~ Material flaw testing {2}
241  DF  .~.~.~.~> Opposed induced voltage sensors
242  DF  .~.~.~.~> Plural sensors

DEFINITION

Classification: 324/240

Material flaw testing:

(under subclass 239) Subject matter wherein the material is magnetically tested for defects in the material.

SEE OR SEARCH THIS CLASS, SUBCLASS:

217+, for rail flaw testing.

219+, for magnetic flaw sensors placed within material tested magnetically.

260+, for magnetic field dated on devices generally including those of the induced voltage type.