US PATENT SUBCLASS 324 / 690
.~.~.~.~ Including a probe type structure

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
686  DF  .~.~.~ With a capacitive sensing means {4}
690.~.~.~.~ Including a probe type structure

DEFINITION

Classification: 324/690

Including a probe type structure:

(under subclass 686) Subject matter wherein the capacitive sensing means has a particular shape or configuration to improve its transducing or pickup function.

SEE OR SEARCH THIS CLASS, SUBCLASS:

724, for probe used in measuring lumped type parameters by resistive or conductive type measurements.