US PATENT SUBCLASS 324 / 721
.~.~.~.~ For temperature variation

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
720  DF  .~.~.~ With compensation means {1}
721.~.~.~.~ For temperature variation

DEFINITION

Classification: 324/721

For temperature variation:

(under subclass 720) Subject matter including means to offset effects caused by changes in the ambient temperature.

SEE OR SEARCH THIS CLASS, SUBCLASS:

670, for measuring or testing lumped type parameters by capacitive type measurement including dielectric characteristic measurement with compensation for temperature variations.

685, for measuring or testing lumped type parameters by capacitive type measurement with compensation for temperature variations.