US PATENT SUBCLASS 324 / 606
.~.~.~ Including a signal comparison circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
602  DF  .~ With auxiliary means to condition stimulus/response signals {3}
605  DF  .~.~ For response signal evaluation or processing {3}
606.~.~.~ Including a signal comparison circuit

DEFINITION

Classification: 324/606

Including a signal comparison circuit:

(under subclass 605) Subject matter wherein the several quantities are matched for the purpose of determining their relative values to evaluate signal correlation, difference or compensation.

SEE OR SEARCH THIS CLASS, SUBCLASS:

647, for a comparison or difference signal evaluation or process is used in the measurement of transmitted or reflected energy distributions.

656, for a comparison or difference signal evaluation or process is used in inductive type measurements.

665, for a comparison or difference signal evaluation process is used in capacitive type measurements for water content of objects.

672, for a comparison or difference signal evaluation or process is used where a material or object forms part of a dielectric characteristic under measurement.

705, for a comparison or difference signal evaluation or process is used in resistive or conductive type measurements.