US PATENT SUBCLASS 324 / 352
.~.~.~.~ Combined with artificial source measurement

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

323  DF  OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU {7}
347  DF  .~ Using electrode arrays, circuits, structure, or supports {2}
348  DF  .~.~ For detecting naturally occurring fields, currents, or potentials {2}
351  DF  .~.~.~ Within a borehole {2}
352.~.~.~.~ Combined with artificial source measurement

DEFINITION

Classification: 324/352

Combined with artificial source measurement:

(under subclass 351) Subject matter including one or more additional types of electrode measurements employing a source of electrical energy other than a natural source.

(1) Note. The "additional" types of measurements include only those which would be classified within this class (324).