US PATENT SUBCLASS 324 / 523
.~.~.~ Of an applied test signal

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
512  DF  .~ For fault location {10}
522  DF  .~.~ By voltage or current measuring {2}
523.~.~.~ Of an applied test signal

DEFINITION

Classification: 324/523

Of an applied test signal:

(under subclass 522) Subject matter where a measured fault signal is derived from the voltage or current of a applied test signal to indicate the location of the fault.

SEE OR SEARCH THIS CLASS, SUBCLASS:

527+, for applying a test signal where means other than voltage or current are measured to locate a fault.