US PATENT SUBCLASS 324 / 76.42
.~.~.~ With sampler

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.39  DF  .~ Frequency of cyclic current or voltage (e.g., cyclic counting etc.) {6}
76.41  DF  .~.~ Frequency comparison, (e.g., heterodyne, etc.) {4}
76.42.~.~.~ With sampler

DEFINITION

Classification: 324/76.42

With sampler:

(under subclass 76.41) Subject matter including a device whose output is a series of discrete values representative of the values of an input at a series of points in time.

SEE OR SEARCH THIS CLASS, SUBCLASS:

76.15, for sampling in amplitude distribution devices.

76.24, for sampling in a frequency spectrum analyzer.

76.38, for sampling, per se, in analysis of complex waves current, or voltage.

76.58, for sampling in digital output by phase comparison.