US PATENT SUBCLASS 324 / 696
.~.~.~.~.~ With a probe structure

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
693  DF  .~.~.~ With object or substance characteristic determination using conductivity effects {5}
694  DF  .~.~.~.~ To determine water content {2}
696.~.~.~.~.~ With a probe structure

DEFINITION

Classification: 324/696

With a probe structure:

(under subclass 694) Subject matter with a particular sensing configuration.

SEE OR SEARCH THIS CLASS, SUBCLASS:

724, for conductivity effects detectors having a probe type structure, per se.

SEE OR SEARCH CLASS

73, Measuring and Testing,

304, for liquid level measurements.

361, Electricity: Electrical Systems and Devices,

280+, for condition responsive capacitors.