US PATENT SUBCLASS 324 / 71.3
.~ Beam of atomic particles

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

71.1  DF  DETERMINING NONELECTRIC PROPERTIES BY MEASURING ELECTRIC PROPERTIES {5}
71.3.~ Beam of atomic particles

DEFINITION

Classification: 324/71.3

Beam of atomic particles:

(under subclass 71.1) Subject matter where the property being measured is some characteristic of a beam of atomic particles.