US PATENT SUBCLASS 324 / 214
.~ By paramagnetic particles


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

200  DF  MAGNETIC {24}
214.~ By paramagnetic particles {2}
215  DF  .~.~> With pattern enhancing additive
216  DF  .~.~> Flaw testing


DEFINITION

Classification: 324/214

By paramagnetic particles:

(under subclass 200) Subject matter which includes a magnetic field detector composed of particles including ferromagnetic material which, when placed in the magnetic field, align themselves in the direction of the tested magnetic field to form a visual representation of the tested magnetic field.

(1) Note. The particles may be of iron, nickel, or cobalt material.

(2) Note. The particles when in the magnetic field act as both a magnetic field detector and a visual indicator of the pattern of the tested field at the location of the field between the magnetic poles or at the location of the field discontinuities.

SEE OR SEARCH THIS CLASS, SUBCLASS:

200, for the sensing and plotting of magnetic fields.

SEE OR SEARCH CLASS

252, Compositions, 62.51, for magnetic compositions useful for magnetic purposes.