US PATENT SUBCLASS 324 / 456
.~ For flaw detection

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

452  DF  A MATERIAL PROPERTY USING ELECTROSTATIC PHENOMENON {4}
456.~ For flaw detection

DEFINITION

Classification: 324/456

For flaw detection:

(under subclass 452) Subject matter wherein electrostatically charged particles are placed upon the test material and collect at flaw locations to indicate the position of the flaw.

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216, for magnetic particle flaw detection.

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250, Radiant Energy, for flaw testing using fluorescent or luminescent materials.