Electronic File Wrappers | Electronic Patent Documents | Paper Patent Documents | Current as of: June, 1999
| and Services |
DF | CLASS NOTES | |
2 | DF | CONTOUR PLOTTING |
3 | DF | RANGE OR REMOTE DISTANCE FINDING |
3.01 | DF | .~ Triangulation ranging to a point with one projected beam |
3.02 | DF | .~.~ Using photodetection with a fixed axial line of sight |
3.03 | DF | .~.~ Using a source beam with a fixed axial direction or plane |
3.04 | DF | .~.~.~ With a single staring photodetector having one element |
3.05 | DF | .~.~.~.~ Having moving receiver optics |
3.06 | DF | .~.~.~ With a single photodetector having multiple elements |
3.07 | DF | .~.~.~.~ Having electronic scanning of the photodetector |
3.08 | DF | .~.~.~ With at least one paired set of staring photodetectors |
3.09 | DF | .~.~ Requiring scanning of a source beam |
3.1 | DF | .~ Triangulation ranging to a point with two or more projected beams |
3.11 | DF | .~.~ Using photodetection at the source station(s) |
3.12 | DF | .~.~ Using photodetection remote from the source station(s) |
3.13 | DF | .~ Triangulation ranging with photodetection, but with no projected beam |
3.14 | DF | .~.~ Using at least a pair of viewing axes |
3.15 | DF | .~.~.~ With one viewing axis fixed |
3.16 | DF | .~.~.~ With moving optical elements in all viewing axes |
4.01 | DF | .~ With photodetection |
4.02 | DF | .~.~ Of a simulation or test |
4.03 | DF | .~.~ Of focused image size or dimensions |
4.04 | DF | .~.~ Of degree of defocus |
4.05 | DF | .~.~ Of focal point search |
4.06 | DF | .~.~ Of differential amplitude at two source or detector distances |
4.07 | DF | .~.~ Of intensity proportional to distance |
4.08 | DF | .~.~ Of height relative to a light plane |
4.09 | DF | .~.~ Of light interference fringes |
4.1 | DF | .~.~.~ Having different frequency sources |
5.01 | DF | .~.~ Of pulse transit time |
5.02 | DF | .~.~.~ Having return coincide with swept display or detector |
5.03 | DF | .~.~.~ Having one or more return pulse gates or windows |
5.04 | DF | .~.~.~.~ Including a displayed image |
5.05 | DF | .~.~.~ Having pulse transmission trigger significance |
5.06 | DF | .~.~.~.~ Including optical pick-off of transmission start |
5.07 | DF | .~.~.~.~.~ With specific counter type timing of returns |
5.08 | DF | .~.~.~.~ Including specific counter type timing of returns |
5.09 | DF | .~.~ Of frequency difference |
5.1 | DF | .~.~ Of CW phase delay |
5.11 | DF | .~.~.~ Having multiple carrier or modulation frequencies |
5.12 | DF | .~.~.~.~ Including an alternating reference path |
5.13 | DF | .~.~.~ Having an alternating reference path |
5.14 | DF | .~.~.~ Having polarization discrimination |
5.15 | DF | .~.~.~ Having specific IF mixing of returns |
6 | DF | .~ Instrument condition testing or indicating |
7 | DF | .~ Periscope or offset type |
8 | DF | .~ With view finder |
9 | DF | .~ Base line instrument (i.e., base is a part of instrument) |
10 | DF | .~.~ With filter or light valve |
11 | DF | .~.~ Range finder combined with height finder |
12 | DF | .~.~ Stereoscopic |
13 | DF | .~.~.~ Ortho-pseudo type |
14 | DF | .~.~.~ Stationary measuring marks |
15 | DF | .~.~ Length of base line variable |
16 | DF | .~.~ Image displaced by moving refracting element |
17 | DF | .~.~ Image displaced by rotating reflecting element |
18 | DF | .~.~ With mounting, supporting, adjusting, or folding structure |
19 | DF | .~.~ Prism structure for determining coincidence |
20 | DF | .~ External basis type |
21 | DF | .~.~ Object size or distance known |
22 | DF | .~.~.~ With displaced images |
23 | DF | MOTION STOPPING (E.G., STROBOSCOPES) |
24 | DF | .~ Periodically moving reflecting or refracting element |
25 | DF | .~ Periodically moving light interrupting element |
26 | DF | .~.~ Vibrating or oscillating element |
27 | DF | VELOCITY OR VELOCITY/HEIGHT MEASURING |
28 | DF | .~ With light detector (e.g., photocell) |
28.5 | DF | .~.~ Of light interference (e.g., interferometer) |
29 | DF | OPTICAL ELEMENT OR RETICLE RESPONDS TO RELATIVE VELOCITY OF REMOTE OBJECT |
30 | DF | CRYSTAL OR GEM EXAMINATION |
31 | DF | .~ Axes determination |
32 | DF | MATERIAL STRAIN ANALYSIS |
33 | DF | .~ With polarized light |
34 | DF | .~.~ Attached detector |
35 | DF | .~.~ Sheet material |
35.5 | DF | .~ By light interference detector (e.g., interferometer) |
36 | DF | WITH SAMPLE PREPARATION |
37 | DF | .~ Condensation nuclei detector |
38 | DF | .~ Depositing particles on optical surface |
39 | DF | BLOOD ANALYSIS |
40 | DF | .~ Hemoglobin concentration |
41 | DF | .~.~ Oximeters |
42 | DF | .~.~ Standards |
43 | DF | OPTICAL PYROMETERS |
44 | DF | .~ With sample engaging rod or tube |
45 | DF | .~ Plural color responsive |
46 | DF | .~ With incandescent standard |
47 | DF | .~.~ Automatic intensity control |
48 | DF | .~.~ Modulating (e.g., flicker beam) |
49 | DF | .~.~ Telescopic |
50 | DF | .~.~.~ Current control |
51 | DF | INFRARED AND ULTRAVIOLET |
52 | DF | EGG CANDLING |
53 | DF | .~ Photoelectric |
54 | DF | .~ With counting, marking, or weighing |
55 | DF | .~ With egg transfer |
56 | DF | .~.~ With egg turning or jarring |
57 | DF | .~.~.~ Endless conveyor |
58 | DF | .~.~ Endless conveyor |
59 | DF | .~.~ Manual transfer |
60 | DF | .~.~.~ With light shading chamber |
61 | DF | .~.~.~ Portable receptacles |
62 | DF | .~ With light shading chamber |
63 | DF | .~.~ Hood type |
64 | DF | .~ With light box |
65 | DF | .~.~ With egg turning or jarring |
66 | DF | .~.~ With particular illumination means |
67 | DF | .~.~.~ With particular electrical switching |
68 | DF | .~ Lamp attachments |
69 | DF | CUTTING BLADE SHARPNESS |
70 | DF | OIL TESTING (E.G., CONTAMINATION) |
71 | DF | DOCUMENT PATTERN ANALYSIS OR VERIFICATION |
72 | DF | WITH PLURAL DIVERSE TEST OR ART |
73 | DF | PLURAL TEST |
73.1 | DF | FOR OPTICAL FIBER OR WAVEGUIDE INSPECTION |
300 | DF | BY DISPERSED LIGHT SPECTROSCOPY |
301 | DF | .~ With Raman type light scattering |
302 | DF | .~ For spectrographic (i.e., photographic) investigation |
303 | DF | .~.~ With spectral analysis |
304 | DF | .~.~ With sectored disc |
305 | DF | .~.~ With diffraction grating |
306 | DF | .~ With internal standard comparison |
307 | DF | .~ With background radiation comparison |
308 | DF | .~ With synchronized spectrum repetitive scanning (e.g., cathode-ray readout) |
309 | DF | .~.~ Using plural beams |
310 | DF | .~ With aperture mask |
311 | DF | .~ With sample excitation (e.g., burning) |
312 | DF | .~.~ By electrical resistance heating (e.g., graphite tube) |
313 | DF | .~.~ By arc or spark |
314 | DF | .~.~.~ Including sputtering |
315 | DF | .~.~ By flame |
316 | DF | .~.~ By high frequency field (e.g., plasma discharge) |
317 | DF | .~.~ By light |
318 | DF | .~.~.~ Monochromatic (e.g., laser) |
319 | DF | .~ Utilizing a spectrophotometer (i.e., plural beam) |
320 | DF | .~.~ Having plural wavelengths |
321 | DF | .~.~ Having servo equalization |
322 | DF | .~.~.~ With polarized light beams |
323 | DF | .~.~ Having beam modulation |
324 | DF | .~.~.~ With plural dispersion |
325 | DF | .~.~.~ Prior to testing |
326 | DF | .~ Utilizing a spectrometer |
327 | DF | .~.~ Having light polarizing means |
328 | DF | .~.~ Having diffraction grating means |
329 | DF | .~.~.~ Including servo slit adjustment means |
330 | DF | .~.~ Having optical gating means |
331 | DF | .~ With monochromator structure |
332 | DF | .~.~ Having adjustable color or bandwidth |
333 | DF | .~.~.~ In a double monochromator |
334 | DF | .~.~.~ With diffraction grating means |
335 | DF | FOR SIZE OF PARTICLES |
336 | DF | .~ By particle light scattering |
337 | DF | BY PARTICLE LIGHT SCATTERING |
338 | DF | .~ With photocell detection |
339 | DF | .~.~ At right angles to the light beam (e.g., nephelometer) |
340 | DF | .~.~ At variable angle to the light beam |
341 | DF | .~.~ For light comparison means |
342 | DF | .~.~ Of back-scattered light |
343 | DF | .~.~ Using plural photocells |
344 | DF | BY ELECTROPHORESIS |
345 | DF | BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) |
346 | DF | .~ Spectroscopy |
347 | DF | .~ Holography |
348 | DF | .~.~ For optical configuration |
349 | DF | .~ With light beams of different frequency (e.g., heterodyning) |
350 | DF | .~.~ For rotation rate (e.g., ring laser) |
351 | DF | .~ With polarization |
352 | DF | .~ With partially reflecting plates in series (e.g., Fabry-Perot type) |
353 | DF | .~ With shearing |
354 | DF | .~ With wavefront division (e.g., by diffraction) |
355 | DF | .~.~ For dimensional measurement (e.g., thickness) |
356 | DF | .~.~.~ Of displacement or distance |
357 | DF | .~ For dimensional measurement (e.g., thickness) |
358 | DF | .~.~ Of displacement or distance |
359 | DF | .~ For optical configuration |
360 | DF | .~.~ With two light beams (e.g., Twyman-Green) |
361 | DF | .~ For refractive indexing |
362 | DF | .~.~ With Schlieren effect |
363 | DF | .~ For orientation and alignment |
364 | DF | BY POLARIZED LIGHT EXAMINATION |
365 | DF | .~ With birefringent element |
366 | DF | .~ With polariscopes |
367 | DF | .~.~ Including polarimeters |
368 | DF | .~.~.~ With electro-optical light rotation |
369 | DF | .~ Of surface reflection |
370 | DF | .~ With light attenuation |
371 | DF | FOR FLATNESS |
121 | DF | LAMP BEAM DIRECTION OR PATTERN |
122 | DF | .~ With lamp focusing |
123 | DF | FOCAL POSITION OF LIGHT SOURCE |
124 | DF | LENS OR REFLECTIVE IMAGE FORMER TESTING |
124.5 | DF | .~ For optical transfer function |
125 | DF | .~ Focal length measuring |
126 | DF | .~.~ Deflecting or interrupting optical path |
127 | DF | .~ Optical center, cylinder axis, or prism measuring or determining |
128 | DF | REFRACTION TESTING (E.G., REFRACTOMETERS) |
129 | DF | .~ Schlieren effect |
130 | DF | .~ Differential |
131 | DF | .~.~ With servo controlled optical member |
132 | DF | .~.~.~ Reflective optical member |
133 | DF | .~ Refractive rod engages specimen |
134 | DF | .~ Prism forming fluid specimen container |
135 | DF | .~ Prism engaging specimen |
136 | DF | .~.~ Internally reflecting prism |
137 | DF | .~.~ Plural prisms |
138 | DF | ANGLE MEASURING OR ANGULAR AXIAL ALIGNMENT |
139 | DF | .~ Plural scales or different portions of same scale simultaneously observable |
139.01 | DF | .~ Star/Sun/Satellite position indication with photodetection |
139.02 | DF | .~.~ With reticle or slot |
139.03 | DF | .~ Relative attitude indication along 3 axes with photodetection |
139.04 | DF | .~ Automatic following or aligning while indicating measurement |
139.05 | DF | .~.~ With optical elements moving relative to fixed housing to follow or align |
139.06 | DF | .~.~ With optical housing moving to follow or align |
139.07 | DF | .~.~ With photodetection of reflected beam angle with respect to a unidirectional source beam |
139.08 | DF | .~.~.~ With source beam moving to follow or align |
139.09 | DF | .~ Wheel alignment with photodetection |
139.1 | DF | .~ Photodetection of inclination from level or vertical |
140 | DF | .~ Apex of angle at observing or detecting station |
141.1 | DF | .~.~ With photodetection of reflected beam angle with respect to a unidirectional source beam |
141.2 | DF | .~.~ With photodetection |
141.3 | DF | .~.~.~ With unidirectional or planar source beam directed at the photodetecting station |
141.4 | DF | .~.~.~ With optical scanning of light beam or detector |
141.5 | DF | .~.~.~ With at least 2-dimensional sensitivity |
142 | DF | .~.~ Scale and remote point simultaneously observable |
143 | DF | .~.~.~ Artificial reference |
144 | DF | .~.~ With plural images |
145 | DF | .~.~.~ Lines of sight relatively adjustable with two degrees of freedom |
146 | DF | .~.~.~ Two or more lines of sight deflected |
147 | DF | .~.~ Measurement in two planes (e.g., azimuth and elevation; hour angle and declination) |
148 | DF | .~.~ Artificial reference |
149 | DF | .~.~.~ Gyroscope or pendulum stabilized optical element |
150 | DF | .~ Sides of angle or axes being aligned transverse to optical axis (e.g., drift meter) |
151 | DF | .~.~ With light pulsing or interrupting means |
152.1 | DF | .~ With photodetection remote from measured angle |
152.2 | DF | .~.~ With reflection of a unidirectional source beam from a planar or nonretroreflective surface |
152.3 | DF | .~.~ With reflection of a unidirectional source beam from a retroreflector |
153 | DF | .~ Alignment of axes nominally coaxial |
154 | DF | .~ With screen |
155 | DF | .~.~ Wheel alignment |
372 | DF | BY MENSURATION |
373 | DF | .~ Of article displacement |
374 | DF | .~.~ Including moire' fringe generation |
375 | DF | .~ Of position |
376 | DF | .~ Of contour or profile |
377 | DF | .~.~ With curve readers |
378 | DF | .~ Of cavities |
379 | DF | .~ Of area or volume |
380 | DF | .~.~ By scanning |
381 | DF | .~ Of thickness |
382 | DF | .~.~ Of light permeable material |
383 | DF | .~ Of length |
384 | DF | .~ Of width or diameter |
385 | DF | .~.~ Of moving object |
386 | DF | .~.~.~ By scanning or light interruption |
387 | DF | .~.~ By scanning or light interruption |
388 | DF | BY CONFIGURATION COMPARISON |
389 | DF | .~ With photosensitive film or plate |
390 | DF | .~ With two images of single article compared |
391 | DF | .~ With projection on viewing screen |
392 | DF | .~.~ For comparison with master or desired configuration |
393 | DF | .~.~.~ Having master or desired configuration projection |
394 | DF | .~ With comparison to master, desired shape, or reference voltage |
395 | DF | .~ With relatively movable optical grids |
396 | DF | .~ With scale or optical grid displaced relative to remote fiducial mark |
397 | DF | .~ With object being compared and scale superimposed |
398 | DF | .~ With object being compared and light beam moved relative to each other (e.g., scanning) |
399 | DF | BY ALIGNMENT IN LATERAL DIRECTION |
400 | DF | .~ With light detector (e.g., photocell) |
401 | DF | .~ With registration indicia (e.g., scale) |
402 | DF | BY SHADE OR COLOR |
403 | DF | .~ With merging colors or patterns (e.g., Maxwell disc) |
404 | DF | .~ Photography |
405 | DF | .~ Tristimulus examination |
406 | DF | .~ Trichromatic examination |
407 | DF | .~ With sample responsive to plural colors applied simultaneously |
408 | DF | .~ With sequential comparison of sample and standard |
409 | DF | .~ Fluid color transmission examination |
410 | DF | .~.~ Of flowing liquids |
411 | DF | .~.~.~ With plural light detectors (e.g., photocells) |
412 | DF | .~.~ With ionic determination |
413 | DF | .~.~ With variable light path length |
414 | DF | .~.~ With color transmitting filter |
415 | DF | .~.~.~ Including liquid filter comparison |
416 | DF | .~ With color transmitting filter |
417 | DF | .~.~ Included with sample excitation |
418 | DF | .~.~ Including rotating sequential filters |
419 | DF | .~.~ Including multicolor filters |
420 | DF | .~.~ Included with colored light sources |
421 | DF | .~ With reflective multicolor chart or standard |
422 | DF | .~.~ Plate |
423 | DF | .~.~.~ Disk |
424 | DF | .~.~ Drum or endless tape |
425 | DF | .~ With color determination by light intensity comparison |
426 | DF | BY INSPECTION WITH AGITATION OR ROTATION |
427 | DF | .~ Of container contents |
428 | DF | .~ Of containers |
429 | DF | BY MONITORING OF WEBS OR THREAD |
430 | DF | .~ For flaws or imperfections |
431 | DF | .~.~ Including transverse scanning |
432 | DF | FOR LIGHT TRANSMISSION OR ABSORPTION |
433 | DF | .~ By comparison |
434 | DF | .~.~ Photoelectric (e.g., sequential viewing) |
435 | DF | .~.~.~ With plural detectors (e.g., simultaneous viewing) |
436 | DF | .~ Of fluent material |
437 | DF | .~.~ Gas |
438 | DF | .~.~.~ Exhaust, dust or smoke |
439 | DF | .~.~.~.~ Contained |
440 | DF | .~.~ With significant sample holder or supply |
441 | DF | .~.~ Having particles suspended in liquid |
442 | DF | .~.~.~ With light detector |
443 | DF | .~ Of photographic film |
444 | DF | .~.~ With scanning, sweeping, or moving detector over film |
445 | DF | OF LIGHT REFLECTION (E.G., GLASS) |
446 | DF | .~ With diffusion |
447 | DF | .~ With modulation (e.g., flicker beam) |
448 | DF | .~ By comparison |
213 | DF | PHOTOMETERS |
214 | DF | .~ Pupillary |
215 | DF | .~ Integrating |
216 | DF | .~ Heat absorbing (e.g., radiometers) |
217 | DF | .~ Modulating (e.g., flicker beam) |
218 | DF | .~ Photoelectric |
219 | DF | .~.~ Simultaneous sighting and reading measurement |
220 | DF | .~.~ Multiple housings |
221 | DF | .~.~ Responsive to incident or back lighting |
222 | DF | .~.~ Plural detectors |
223 | DF | .~.~ Logarithmic |
224 | DF | .~.~ Multisensitivity range |
225 | DF | .~.~ With predetector light modifier (e.g., diaphragm) |
226 | DF | .~.~ Detector and indicator electrical coupling (e.g., amplifying or attenuating) |
227 | DF | .~.~ With particular indicator |
228 | DF | .~.~.~ Movable scale (e.g., calibrating) |
229 | DF | .~ Comparison |
230 | DF | .~.~ With light standard |
231 | DF | .~.~.~ Variable incandescent standard |
232 | DF | .~.~.~ Standard movable |
233 | DF | .~ With variable light aperture size |
234 | DF | .~ Light absorbing |
235 | DF | .~.~ Absorber continuously variable (e.g., wedge) |
236 | DF | .~ Integrating spheres |
237.1 | DF | INSPECTION OF FLAWS OR IMPURITIES |
238.1 | DF | .~ Textile inspection |
238.2 | DF | .~.~ Elongated textile product (e.g., thread, yarn, etc.) |
238.3 | DF | .~.~ Detection of foreign material (e.g., trash, splinters, contaminants, etc.) |
239.1 | DF | .~ Transparent or translucent material |
239.2 | DF | .~.~ Optical element (e.g., contact lens, prism, filter, lens, etc.) |
239.3 | DF | .~.~ Patterned surface |
239.4 | DF | .~.~ Containers (e.g., bottles) |
239.5 | DF | .~.~.~ Detection of foreign matter on or in container |
239.6 | DF | .~.~.~ Of container contents |
239.7 | DF | .~.~ Surface condition |
239.8 | DF | .~.~.~ Detection of an object or particle on surface |
240.1 | DF | .~ Containers or enclosures (e.g., packages, cans, etc.) |
241.1 | DF | .~ Bore inspection (e.g., borescopes, intrascope, etc.) |
241.2 | DF | .~.~ Firearm bore inspection |
241.3 | DF | .~.~ With adjustable head |
241.4 | DF | .~.~ Flexible |
241.5 | DF | .~.~ Specific construction of distal end |
241.6 | DF | .~.~ Having guiding means |
237.2 | DF | .~ Surface condition |
237.3 | DF | .~.~ Detection of object or particle on surface |
237.4 | DF | .~.~.~ On patterned or topographical surface (e.g., wafer, mask, circuit board) |
237.5 | DF | .~.~ On patterned or topographical surface (e.g., wafer, mask, circuit board) |
237.6 | DF | .~ Having predetermined light transmission regions (e.g., holes, aperture, multiple material articles) |
242.1 | DF | THREAD COUNTING |
243.1 | DF | STANDARD |
243.2 | DF | .~ For fluid suspended particles |
243.3 | DF | .~ Flying height testers |
243.4 | DF | .~ Surface standard |
243.5 | DF | .~.~ Color |
243.6 | DF | .~.~ Foreign object |
243.7 | DF | .~.~ Texture |
243.8 | DF | .~.~ Light intensity |
244 | DF | SAMPLE, SPECIMEN, OR STANDARD HOLDER OR SUPPORT (E.G., PLATES OR SLIDES) |
245 | DF | .~ Cotton graders |
246 | DF | .~ Fluid containers (e.g., cells or cuvettes) |
247 | DF | FIDUCIAL INSTRUMENTS |
248 | DF | .~ Artificial reference |
249 | DF | .~.~ Liquid surface (e.g., bubble level) |
250 | DF | .~.~ Pendular suspension of optical element or reticle |
251 | DF | .~ Reticle lies outside viewing path |
252 | DF | .~.~ Reticle image transversely adjustable relative to optical axis |
253 | DF | .~ Deflection of line of sight |
254 | DF | .~.~ Two or more deflections |
255 | DF | .~.~ By reflection |
256 | DF | MISCELLANEOUS |
********************************* | ||
FOREIGN ART COLLECTIONS | ||
********************************* | ||
FOR 100 | DF | INSPECTION FOR FLAWS OR IMPERFECTIONS (356/237) |
FOR 101 | DF | .~ Cloth or thread inspection (356/238) |
FOR 102 | DF | .~ Passing light through a transparent or translucent article (356/239) |
FOR 103 | DF | .~.~ Containers (e.g., bottles) or contents (356/240) |
FOR 104 | DF | .~ Bore inspection (e.g., borescopes) (356/241) |
FOR 105 | DF | THREAD COUNTING (356/242) |
FOR 106 | DF | STANDARDS (356/243) |
********************************* | ||
CROSS REFERENCE ART COLLECTIONS | ||
********************************* | ||
900 | DD | INTERFEROMETERS (GO1B 9/02) |
901 | DD | .~ Involving fiber optics or integrated optics (GO1B 9/02F) |
902 | DD | .~ Involving diffraction gratings (GO1B 9/02G) |
903 | DD | .~ Using holographic techniques (GO1B 9/021) |
904 | DD | MEASURING MICROSCOPES (GO1B 9/04) |
905 | DD | MEASURING TELESCOPES (GO1B 9/06) |
906 | DD | OPTICAL PROJECTION COMPARATORS, E.G., FOR PROFILE (GO1B 9/08) |
907 | DD | GONIOMETERS (GO1B 9/10) |
908 | DD | MEASURING LENGTH, WIDTH, OR THICKNESS (GO1B 11/02) |
909 | DD | .~ By means of tv-camera scanning (GO1B 11/02B) |
910 | DD | .~ By means of diode-array scanning (GO1B 11/02C) |
911 | DD | MEASURING THE DEFORMATION IN A SOLID, E.G., OPTICAL STRAIN GAUGE (GO1B 11/16) |
912 | DD | MEASURING ANGLES (GO1C 1/00) |
913 | DD | .~ Theodolites (GO1C 1/02) |
914 | DD | .~.~ Combined with cameras (GO1C 1/04) |
915 | DD | .~ Sextants (GO1C 1/08) |
916 | DD | ALTIMETERS FOR AIRCRAFT (GO1C 5/00A) |
917 | DD | MEASURING INCLINATION, E.G., BY CLINOMETERS, BY LEVELS (GO1C 9/00) |
918 | DD | PHOTOGRAMMETRY; PHOTOGRAPHIC SURVEYING (GO1C 11/00) |
919 | DD | .~ Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g., controlling overlapping of pictures (GO1C 11/02) |
920 | DD | .~.~ By scanning the object (GO1C 11/02A) |
921 | DD | .~ Interpretation of pictures (GO1C 11/04) |
922 | DD | PHOTOMETRY, E.G., PHOTOGRAPHIC EXPOSURE METER (GO1J 11/04) |
923 | DD | RADIATION PYROMETRY (GOLJ 5/00) |
924 | DD | MEASURING VELOCITY OF LIGHT (GOLJ 7/00) |
925 | DD | MEASURING OPTICAL PHASE DIFFERENCE: MEASURING OPTICAL WAVELENGTH (GO1J 9/00) |
926 | DD | MEASURING THE CHARACTERISTICS OF INDIVIDUAL OPTICAL PULSES OR OF OPTICAL PULSE TRAINS (GO1J 11/00) |
927 | DD | MEASURING VARIATIONS OF OPTICAL PROPERTIES OF MATERIAL WHEN IT IS STRESSED, E.G., BY PHOTOELASTIC STRESS ANALYSIS USING INFRA-RED, VISIBLE LIGHT, ULTRA-VIOLET (GO1L 1/24) |
928 | DD | INVESTIGATING OR ANALYZING MATERIALS BY THE USE OF OPTICAL MEANS, I.E., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1N 21/00) |
929 | DD | .~ Arrangements, or apparatus for facilitating the optical investigation (GO1N 21/01) |
930 | DD | .~.~ Cuvette constructions (GO1N 21/03) |
931 | DD | .~ Systems in which incident light is modified in accordance with the properties of material investigated (GO1N 21/17) |
932 | DD | .~.~ With opto-acoustic detection, e.g., for gases or analyzing solids (GO1N 21/17B) |
933 | DD | .~.~ With calorimetric detection, e.g., with thermal lens detection (GO1N 21/17C) |
934 | DD | .~.~ With modulation of one or more physical properties of the sample during optical investigation, e.g., Electra reflectance (GO1N 21/17M) |
935 | DD | .~.~ Dichroism (GO1N 21/19) |
936 | DD | .~.~ Polarization-affecting properties (GO1N 21/21) |
937 | DD | .~.~.~ Ellipsometry (GO1N 21/21B) |
938 | DD | .~.~.~ Bi-refringence (GO1N 21/23) |
939 | DD | .~.~ Color; spectral properties, i,e., comparison of effect of material on the light at two or more different wavelengths or wavelength bands (GO1N 21/25) |
940 | DD | .~.~.~ Colorimeters (GO1N 21/25B) |
941 | DD | .~.~.~.~ For batch operation, i.e., multi-sample apparatus (GO1N 21/25B2) |
942 | DD | .~.~.~ Arrangements using two alternating lights and one detector (GO1N 21/25D) |
943 | DD | .~.~.~ Using photo-electric detection (GO1N 21/27) |
944 | DD | .~.~.~.~ For following a reaction, e.g., for determining photometrically a reaction rate (GO1N 21/27C) |
945 | DD | .~.~.~ Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g., atomic absorption spectrometry (GO1N 21/31) |
946 | DD | .~.~ Holographic interferometry (GO1N 21/45B) |
947 | DD | .~.~ Scattering, i.e., diffuse reflection (GO1N 21/47F) |
948 | DD | .~ Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light (GO1N 21/62) |
949 | DD | .~.~ Optically excited (GO1N 21/63) |
950 | DD | .~.~.~ Using photolysis and investigating photolyzed fragments (GO1N 21/63C) |
951 | DD | .~.~.~ Florescence; Phosphorescence (GO1N 21/64) |
952 | DD | .~.~.~ Raman scattering (GO1N 21/65) |
953 | DD | .~ Probe photometers (GO1N 21/85B) |
954 | DD | .~ Scan or image signal processing arrangements specially adapted for investigating the presence of flaws or contaminates, e.g., for scan signal adjustments, for detecting different kinds of defects, for compensating for structures (GO1N 21/88) |
955 | DD | MEASURING LINEAR OR ANGULAR SPEED UTILIZING DEVICES CHARACTERIZED BY THE USE OF OPTICAL MEANS, E.G., USING INFRA-RED, VISIBLE, OR ULTRA-VIOLET LIGHT (GO1P 3/36) |
956 | DD | .~ Using a ring laser (GO1P 3/36B) |
957 | DD | .~ Using diffraction of light (GO1P 3/36C) |
958 | DD | .~ Using photographic means (GO1P 3/38) |