US PATENT SUBCLASS 356 / 366
.~ With polariscopes


Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

364  DF  BY POLARIZED LIGHT EXAMINATION {4}
366.~ With polariscopes {1}
367  DF  .~.~> Including polarimeters {1}


DEFINITION

Classification: 356/366

With polariscopes:

(under subclass 364) Subject matter providing structure for examining articles or material and including a polarizer, a polarized light analyzer, a support usually for the article or material for examination between the polarizer and analyzer, and a visual viewer or photoelectric detector and indicator, the polarized light from the polarizer being transmitted through the article or material to the visual viewer or the photoelectric detector and indicator.

SEE OR SEARCH THIS CLASS, SUBCLASS:

30+, for polariscopes used in gem examination.

33+, for polariscopes used in stress-strain examination.

SEE OR SEARCH CLASS

359, Optics: Systems (Including Communication) and Elements,

501, which includes series polarizers relatively adjustable.