US PATENT SUBCLASS 356 / 357
.~ For dimensional measurement (e.g., thickness)

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
357.~ For dimensional measurement (e.g., thickness) {1}
358  DF  .~.~> Of displacement or distance

DEFINITION

Classification: 356/357

For dimensional measurement (e.g., thickness):

(under subclass 345) Subject Matter wherein the interference pattern is indicative of the height, width, depth, or change in position of an object.

SEE OR SEARCH THIS CLASS, SUBCLASS:

3+, for range or remote distance measurement.

355+, for light interference mensuration with wave front division.

372+, for optical mensuration, per se.