US PATENT SUBCLASS 356 / 345
BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS)

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
346  DF  .~> Spectroscopy
347  DF  .~> Holography {1}
349  DF  .~> With light beams of different frequency (e.g., heterodyning) {1}
351  DF  .~> With polarization
352  DF  .~> With partially reflecting plates in series (e.g., Fabry-Perot type)
353  DF  .~> With shearing
354  DF  .~> With wavefront division (e.g., by diffraction) {1}
357  DF  .~> For dimensional measurement (e.g., thickness) {1}
359  DF  .~> For optical configuration {1}
361  DF  .~> For refractive indexing {1}
363  DF  .~> For orientation and alignment

DEFINITION

Classification: 356/345

BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS):

(under the class definition) Subject matter wherein measuring or testing, coherent light beams interact to produce a cancellation or reinforcement of wave energy.

SEE OR SEARCH THIS CLASS, SUBCLASS:

4.09, and 4.1, for light interference measurement of displacement or distance over large distance.

28.5, for light interference measurement of velocity.

35.5, for material strain analysis by light interference measurement and testing.

242, for moiré pattern templates for the determination of the number of threads in fabrics such as stockings.

SEE OR SEARCH CLASS

33, Geometrical Instruments, 700+, for interferometers combined with mechanical means for contacting the workpiece.

73, Measuring and Testing,

71.3, for interferometric vibration measuring.

250, Radiant Energy,

550, for interference pattern detection.

359, Optics: Systems (Including Communication) and Elements,

370+, for interference microscopes; subclass 498 for interference effects with polarized light; and subclasses 577+ for devices in general which utilize the phenomena of light interference.

399, Electrophotography,

9+, for diagnostics of electrophotos:graphic devices, particularly subclasses 31+ for image-forming components.