US PATENT SUBCLASS 356 / 351
.~ With polarization

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
351.~ With polarization

DEFINITION

Classification: 356/351

With polarization:

(under subclass 345) Subject matter wherein the interacting light waves of the interferometer are polarized.

SEE OR SEARCH THIS CLASS, SUBCLASS:

33+, for polarized light used in strain analysis.

364+, for analyzing polarized light.

SEE OR SEARCH CLASS

250, Radiant Energy,

225, for photocells for detecting polarized light. 359, Optics: Systems (Including Communication) and Elements,

370+, for polarization microscopes.