US PATENT SUBCLASS 356 / 361
.~ For refractive indexing

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
361.~ For refractive indexing {1}
362  DF  .~.~> With Schlieren effect

DEFINITION

Classification: 356/361

For refractive indexing:

(under subclass 345) Subject matter wherein the beams are phased in accordance with a refractive index to be measured.

SEE OR SEARCH THIS CLASS, SUBCLASS:

128+, for noninterferometric refractometers.