US PATENT SUBCLASS 356 / 362
.~.~ With Schlieren effect

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
361  DF  .~ For refractive indexing {1}
362.~.~ With Schlieren effect

DEFINITION

Classification: 356/362

With Schlieren effect:

(under subclass 361) Subject matter wherein the interferometric determination of refractive index is combined with a Schlieren test.

SEE OR SEARCH THIS CLASS, SUBCLASS:

129, for Schlieren tests, per se.