US PATENT SUBCLASS 356 / 354
.~ With wavefront division (e.g., by diffraction)

Current as of: June, 1999
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356 /   HD   OPTICS: MEASURING AND TESTING

345  DF  BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) {11}
354.~ With wavefront division (e.g., by diffraction) {1}
355  DF  .~.~> For dimensional measurement (e.g., thickness) {1}

DEFINITION

Classification: 356/354

With wavefront division (e.g., by diffraction):

(under subclass 345) Subject matter wherein the beams to be combined are obtained by dividing the wavefront of an input beam.

(1) Note. This is in contrast to a division of amplitude at a partially reflecting surface.